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1

Multi-valued equal-weight codes for self-checking and matching

Tsung-Chu Huang

Journal:

IEEE Communications Letters

Year:

2009

Language:

english

File:

PDF, 296 KB

english, 2009

2

Reduction of power consumption in scan-based circuits during test application by an input control technique

Tsung-Chu Huang, Kuen-Jong Lee

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2001

Language:

english

File:

PDF, 247 KB

english, 2001

3

High-performance built-in self-routing for through-silicon vias

Huang, Tsung-Chu

Journal:

Electronics Letters

Year:

2012

Language:

english

File:

PDF, 198 KB

english, 2012

4

[IEEE 2007 IEEE International Symposium on Circuits and Systems - New Orleans, LA, USA (2007.05.27-2007.05.30)] 2007 IEEE International Symposium on Circuits and Systems - Congruence Synchronous Mirror Delay

Huang, Tsung-Chu, Chang, Gau-Bin, Li, Ling

Year:

2007

Language:

english

File:

PDF, 476 KB

english, 2007

5

High-yield performance-efficient redundancy analysis for 2D memory

Tsung-Chu Huang

Journal:

SCIENCE CHINA Information Sciences

Year:

2011

Language:

english

File:

PDF, 1.24 MB

english, 2011

6

An Interleaving Technique for Reducing Peak Power in Multiple-Chain Scan Circuits During Test Application

Kuen-Jong Lee, Tsung-Chu Huang

Journal:

Journal of Electronic Testing

Year:

2002

Language:

english

File:

PDF, 248 KB

english, 2002

7

A Low-Power Dependable Berger Code for Fully Asymmetric Communication

Tsung-chu Huang

Journal:

IEEE Communications Letters

Year:

2008

Language:

english

File:

PDF, 191 KB

english, 2008

8

[IEEE Comput. Soc Digest of Papers IEEE International Workshop on IDDQ Testing - Washington, DC, USA (5-6 Nov. 1997)] Digest of Papers IEEE International Workshop on IDDQ Testing - A high-speed low-voltage built-in current sensor

Tsung-Chu Huang,, Min-Cheng Huang,, Kuen-Jong Lee,

Year:

1997

Language:

english

File:

PDF, 445 KB

english, 1997

9

[IEEE Tenth Asian Test Symposium - Kyoto, Japan (19-21 Nov. 2001)] Proceedings 10th Asian Test Symposium - A low-power LFSR architecture

Tsung-Chu Huang,, Kuen-Jong Lee,

Year:

2001

Language:

english

File:

PDF, 109 KB

english, 2001

10

[IEEE Comput. Soc Eighth Asian Test Symposium - Shanghai, China (16-18 Nov. 1999)] Proceedings Eighth Asian Test Symposium (ATS'99) - An input control technique for power reduction in scan circuits during test application

Tsung-Chu Huang,, Kuen-Jeng Lee,

Year:

1999

Language:

english

File:

PDF, 249 KB

english, 1999

11

[IEEE 2009 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT) - Hsinchu, Taiwan (2009.08.31-2009.09.2)] 2009 IEEE International Workshop on Memory Technology, Design, and Testing - Three-Transistor DRAM-Based Content Addressable Memory Design for Reliability and Area Efficiency

Hsu, Wei-Ning, Wu, Tsu-Hsin, Huang, Tsung-Chu

Year:

2009

Language:

english

File:

PDF, 690 KB

english, 2009

12

[IEEE International Test Conference - Baltimore, MD, USA (30 Oct.-1 Nov. 2001)] Proceedings International Test Conference 2001 (Cat. No.01CH37260) - A token scan architecture for low power testing

Tsung-Chu Huang,, Kuen-Jong Lee,

Year:

2001

Language:

english

File:

PDF, 850 KB

english, 2001

13

[IEEE Comput. Soc Sixth Asian Test Symposium (ATS'97) - Akita, Japan (17-19 Nov. 1997)] Proceedings Sixth Asian Test Symposium (ATS'97) - Built-in current sensor designs based on the bulk-driven technique

Tsung-Chu Huang,, Min-Cheng Huang,, Kuen-Jong Lee,

Year:

1997

Language:

english

File:

PDF, 478 KB

english, 1997

14

[IEEE Comput. Soc. Press Fifth Asian Test Symposium (ATS'96) - Hsinchu, Taiwan (20-22 Nov. 1996)] Proceedings of the Fifth Asian Test Symposium (ATS'96) - Combination of automatic test pattern generation and built-in intermediate voltage sensing for detecting CMOS bridging faults

Kuen-Jong Lee,, Jing-Jou Tang,, Tsung-Chu Huang,, Cheng-Liang Tsai,

Year:

1996

Language:

english

File:

PDF, 632 KB

english, 1996

15

[IEEE 2010 19th Asian Test Symposium (ATS) - Shanghai, China (2010.12.1-2010.12.4)] 2010 19th IEEE Asian Test Symposium - HYPERA: High-Yield Performance-Efficient Redundancy Analysis

Huang, Tsung-Chu, Lu, Kuei-Yeh, Huang, Yen-Chieh

Year:

2010

Language:

english

File:

PDF, 710 KB

english, 2010

16

[IEEE 2007 IEEE International Workshop on Memory Technology, Design and Testing (MTDT) - Taipei, Taiwan (2007.12.3-2007.12.5)] 2007 IEEE International Workshop on Memory Technology, Design and Testing - Power-gating current test for static RAM in nanotechnologies

Yuan-Wei Chao,, Hsin-Ling Chen,, Chih-Jong Chen,, Tsung-Chu Huang,

Year:

2007

Language:

english

File:

PDF, 368 KB

english, 2007

17

[IEEE 2006 International Symposium on VLSI Design, Automation and Test - Ambassador Hotel, Hsinchu (2006.4.26-2006.4.26)] 2006 International Symposium on VLSI Design, Automation and Test - A Supply-Gating Scheme for Both Data-Retention and Spike-Reduction in Power Management and Test Scheduling

Huang, Tsung-chu, Tzeng, Jing-chi, Chao, Yuan-wei, Chen, Ji-jan, Liu, Wei-ting, Lee, Kuen-jong

Year:

2006

Language:

english

File:

PDF, 2.55 MB

english, 2006

18

Cluster Error Correction for Real-Time Channels by Unbound Rotation of Two-Dimensional Parity-Check Codes

Huang, Tsung-Chu

Journal:

IEEE Communications Letters

Year:

2015

Language:

english

File:

PDF, 346 KB

english, 2015

19

Cluster-error correction for through-silicon vias in 3D ICs

Huang, Tsung-Chu

Journal:

Electronics Letters

Year:

2015

Language:

english

File:

PDF, 241 KB

english, 2015

20

BIFEST: a built-in intermediate fault effect sensing and test generation system for CMOS bridging faults

Lee, Kuen-Jong, Tang, Jing-Jou, Huang, Tsung-Chu

Journal:

ACM Transactions on Design Automation of Electronic Systems

Year:

1999

Language:

english

File:

PDF, 204 KB

english, 1999

21

[IEEE 2015 6th Asia Symposium on Quality Electronic Design (ASQED) - Kula Lumpur, Malaysia (2015.8.4-2015.8.5)] 2015 6th Asia Symposium on Quality Electronic Design (ASQED) - Cluster error correction and on-line repair for real-time TSV array

Huang, Tsung-Chu

Year:

2015

Language:

english

File:

PDF, 1009 KB

english, 2015

22

[IEEE 2018 IEEE 27th Asian Test Symposium (ATS) - Hefei, China (2018.10.15-2018.10.18)] 2018 IEEE 27th Asian Test Symposium (ATS) - Precompensation, BIST and Analogue Berger Codes for Self-Healing of Neuromorphic RRAM

Huang, Tsung-Chu, Schroff, Jeffae

Year:

2018

Language:

english

File:

PDF, 461 KB

english, 2018

23

[IEEE 2019 IEEE International Conference on Consumer Electronics - Taiwan (ICCE-TW) - YILAN, Taiwan (2019.5.20-2019.5.22)] 2019 IEEE International Conference on Consumer Electronics - Taiwan (ICCE-TW) - Low-Cost and Fast Design of Precise Activation Functions in Neural Network

Huang, Tsung-Chu, Chiang, Chun-Hao, Lin, Mo-Han

Year:

2019

Language:

english

File:

PDF, 3.00 MB

english, 2019

24

[IEEE 2020 IEEE International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan) - Taoyuan, Taiwan (2020.9.28-2020.9.30)] 2020 IEEE International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan) - Residue Number System Design Automation for Neural Network Acceleration

Lin, Liang-Yu, Schroff, Jerrae, Lin, Tsu-Ping, Huang, Tsung-Chu

Year:

2020

File:

PDF, 670 KB

2020

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